Fast Super-Resolved Microscopy with a Structured Illumination and Extended Depth Detection.
Chinese Academy of SciencesResearchers at Institut Fresnel have developed an Extended Depth-of-Field Random Illumination Microscope (EDF-RIM) that integrates 3D speckle illumination for super-resolved imaging and extended depth detection for faster acquisition of thick samples. EDF-RIM captures entire 3D volumes in a single projection, reducing acquisition time and light exposure.